IEC QUALITY ASSESSMENT SYSTEM (IECQ)
For rules and details of the IECQ visit www.iecq.org |
IECQ Certificate of Conformity
IECQ ESD (Electro Static Discharge)
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IECQ Certificate No.: | IECQ-P SGSCN 24.0001 | Issue No.: | 1 | Status: | Current |
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Supersedes: | | Issue Date: | 2024/11/18 | Org. Issue: | 2024/11/18 |
CB Reference No.: | CN24/00007308 | Expiration: | 2027/11/17 | | |
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Hefei Lianchuang Optics Co., Ltd.
No. 28, Yuzhu Road, High-tech Zone, Hefei City, Anhui Province, P.R.
China
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The organization has developed and implemented procedures and related processes that have been assessed by the IECQ Certification Body in accordance with IECQ 03-1 and IECQ 03-2 for issuance of this certificate and found to be in conformity with the applicable requirements of the IECQ Approved Process Scheme and in respect of standard(s) or specification(s):
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- IEC 61340-5-1:2024 {Ed 3.0} Electrostatics – Part 5-1: Protection of electronic devices from electrostatic phenomena – General requirements
- ANSI ESD S20.20 {2021} ESD Association Standard for the Development of an Electrostatic Discharge Control Program for Protection of Electrical and Electronic Parts, Assemblies and Equipment (Excluding Electrically Initiated Explosive Devices)
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Process Manual Reference: | IEC61340-5-1:2024 (ED3.0) | |
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Scope of Activity: | | | |
Manufacture of image modules |
Issued by the Certification Body: SGS-CSTC Standards Technical Services Co. Ltd. |
16F Century YuHui Mansion, 73 Fucheng Road, Beijing
China
Authorised Person: Tsang Ben
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The validity of this certificate is maintained through on-going surveillance audits by the IECQ CB issuing this certificate. This Certificate of Conformity may be suspended or withdrawn in accordance with the
Rules of Procedure of the IECQ System and its Schemes.
This certificate and any schedule(s) may only be reproduced in full.
This certificate is not transferable and remains the property of the issuing IECQ CB.
The Status and authenticity of this certificate may be verified by visiting www.iecq.org.
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IECQ-P Rev. 07 EN
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